Title: Assessment of oxide reliability and hot carrier degradation in CMOS technology
Authors: Maes, Herman ×
Groeseneken, Guido
Degraeve, Robin
De Blauwe, Jan
Van den Bosch, G #
Issue Date: 1998
Publisher: North-Holland
Series Title: Microelectronic Engineering vol:40 pages:147-66
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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