Title: Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs
Authors: Hayama, K ×
Takakura, T
Ohyama, H
Kuboyama, S
Matsuda, S
Rafi, J.M
Mercha, Abdelkarim
Simoen, Eddy
Claeys, Corneel #
Issue Date: 2005
Series Title: Microelectronics Reliability vol:45 issue:09/11/07 pages:1376-1381
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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