Title: Study of recombination and transport characteristics in strain-relaxed Si-SiGe layers
Authors: Gaubas, Eugenijus ×
Tomasiunas, R
Eneman, Geert
Delhougne, Romain
Simoen, Eddy #
Issue Date: 2005
Series Title: Semiconductor Science and Technology vol:20 issue:10 pages:1052-1063
ISSN: 0268-1242
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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