Title: Characterization of the Vt-instability un SiO2 HFO2 gate dielectrics
Authors: Kerber, Andreas ×
Cartier, E
Pantisano, Luigi
Rosmeulen, Maarten
Degraeve, Robin
Kauerauf, Thomas
Groeseneken, Guido
Maes, Herman
Schwalke, U #
Issue Date: 2003
Publisher: IEEE
Host Document: pages:41-45
Conference: Proceedings 41st Annual IEEE International Reliability Physics Symposium location:Leuven Belgium date:30/03/03
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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