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Title: Bulk defect induced low-frequency noise in n+-p silicon diodes
Authors: Hou, F. C ×
Bosman, Gijs
Simoen, Eddy
Vanhellemont, Jan
Claeys, Cor #
Issue Date: 1998
Series Title: IEEE Transactions on Electron Devices vol:45 issue:12 pages:2528-2536
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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