Title: New insights into the relation between channel hot carrier degradation and oxide breakdown in short channel nMOSFETs
Authors: Crupi, Felice ×
Kaczer, Ben
Groeseneken, Guido
De Keersgieter, An #
Issue Date: 2003
Series Title: IEEE Electron Device Letters vol:24 issue:4 pages:278-280
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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