Title: Hole trap generation in gate dielectric during substrate hole injection
Authors: Zhang, J.F ×
Sii, H.K
Chen, A.H
Zhao, C.Z
Uren, M.J
Groeseneken, Guido
Degraeve, Robin #
Issue Date: 2004
Publisher: IOP Pub.
Series Title: Semiconductor Science and Technology vol:19 issue:1 pages:L1-L3
ISSN: 0268-1242
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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