|ITEM METADATA RECORD
|Title: ||Impact of the high vertical electric field on low-frequency noise in thin-gate oxide MOSFETs|
|Authors: ||Mercha, Abdelkarim ×|
Claeys, Corneel #
|Issue Date: ||2003 |
|Series Title: ||IEEE Transactions on Electron Devices vol:50 issue:12 pages:2520-2527|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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