Title: Dynamics of threshold voltage instability in stacked high-k dielectrics: role of the interfacial oxide
Authors: Pantisano, Luigi ×
Cartier, Eduard
Kerber, Andreas
Degraeve, Robin
Lorenzini, Martino
Rosmeulen, Maarten
Groeseneken, Guido
Maes, Herman #
Issue Date: 2003
Publisher: IEEE
Host Document: pages:163-164
Conference: VLSI Technology Symposium location:Leuven Belgium date:10/06/03
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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