|ITEM METADATA RECORD
|Title: ||Short-channel effects in the Lorentzian noise induced by the EVB tunneling in partially depleted SOI MOSFETs|
|Authors: ||Lukyanchikova, N ×|
Claeys, Corneel #
|Issue Date: ||2004 |
|Series Title: ||Solid-State Electronics vol:48 issue:5 pages:747-758|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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