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Title: Incubation, time-dependent drift and saturation during Al-Si-Cu electromigration: modelling and implications for design
Authors: Witvrouw, Ann ×
Roussel, Philippe
Beyer, Gerald
Proost, Joris
Maex, Karen #
Issue Date: 1998
Host Document: roceedings of the IEEE 1998 International Interconnect Technology Conference pages:27-29
Conference: IEEE 1998 International Interconnect Technology Conference. location:San Francisco, CA, USA date:Jun 1-3 1998
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
Department of Materials Engineering - miscellaneous
× corresponding author
# (joint) last author

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