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Title: New interface state density extraction method applicable to peaked and high-density distributions for Ge MOSFET development
Authors: Martens, Koen ×
De Jaeger, Brice
Bonzom, Renaud
Van Steenbergen, Jan
Meuris, Marc
Groeseneken, Guido
Maes, Herman #
Issue Date: 2006
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Electron Device Letters vol:27 issue:5 pages:405-408
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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