Title: High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices
Authors: Vassilev, Vesselin ×
Jenei, Snezana
Groeseneken, Guido
Venegas, Rafael
Thijs, Steven
De Heyn, Vincent
Mahadeva Iyer, Natarajan
Steyaert, Michel
Maes, Herman #
Issue Date: 2003
Series Title: Microelectronics Reliability vol:43 issue:7 pages:1011-1020
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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