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Title: | Radiation damage of Si photodiodes by high-temperature irradiation |
Authors: | Ohyama, H × Takakura, K Shigaki, K Kuboyama, S Matsuda, S Simoen, Eddy Claeys, Corneel # |
Issue Date: | 2003 |
Series Title: | Microelectronic Engineering vol:66 issue:01/04/07 pages:536-541 |
ISSN: | 0167-9317 |
Publication status: | published |
KU Leuven publication type: | IT |
Appears in Collections: | Associated Section of ESAT - INSYS, Integrated Systems
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# (joint) last author |
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