Title: Radiation damage of Si photodiodes by high-temperature irradiation
Authors: Ohyama, H ×
Takakura, K
Shigaki, K
Kuboyama, S
Matsuda, S
Simoen, Eddy
Claeys, Corneel #
Issue Date: 2003
Series Title: Microelectronic Engineering vol:66 issue:01/04/07 pages:536-541
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science