|ITEM METADATA RECORD
|Title: ||Effect of irradiation temperature on radiation damage in electron-irradiated MOS FETs|
|Authors: ||Ohyama, H ×|
Claeys, Corneel #
|Issue Date: ||2003 |
|Series Title: ||Microelectronic Engineering vol:66 issue:01/04/07 pages:530-535|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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