Title: Effect of irradiation temperature on radiation damage in electron-irradiated MOS FETs
Authors: Ohyama, H ×
Hayama, K
Takakura, K
Jono, T
Simoen, Eddy
Claeys, Corneel #
Issue Date: 2003
Series Title: Microelectronic Engineering vol:66 issue:01/04/07 pages:530-535
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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