Title: ESD reliability issues in sub-micron CMOS - trends and challenges
Authors: Mahadeva Iyer, Natarajan
Vassilev, Vesselin
Thijs, Steven
De Heyn, Vincent
Daenen, Tom
Groeseneken, Guido
Issue Date: 2003
Conference: 2nd MRS Int. Conf. on Materials for Advanced Technologies & IUMRS location:Leuven Belgium date:07/12/03
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors

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