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|ITEM METADATA RECORD
|Title: ||Experimental investigation of the impact of line-edge roughness on MOSFET performance and yield|
|Authors: ||Croon, Jeroen ×|
Maes, Herman #
|Issue Date: ||2003 |
|Host Document: ||pages:227-230|
|Conference: ||33rd European Solid-State Devices Research Conference - ESSDERC location:Leuven Belgium date:16/09/03|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||ESAT - MICAS, Microelectronics and Sensors|
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author|
# (joint) last author|
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