Title: Progress towards a physical contact model for scanning spreading resistance microscopy
Authors: Eyben, Pierre ×
Denis, Samuel
Clarysse, Trudo
Vandervorst, Wilfried #
Issue Date: Sep-2003
Publisher: Elsevier Sequoia
Series Title: Materials Science and Engineering B, Solid-State Materials for Advanced Technology vol:102 issue:1-3 pages:132-137
ISSN: 0921-5107
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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