Title: A unified hot carrier degradation model for integrated lateral and vertical nDMOS transistors
Authors: Moens, P ×
Van den Bosch, Geert
Groeseneken, Guido
Bolognesi, D #
Issue Date: 2003
Publisher: IEEE
Host Document: pages:88-91
Conference: 15th International Symposium on Power Semiconductor Devices & ICs - ISPSD location:Oudenaarde Belgium date:14/04/03
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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