Title: Influence of device geometry on ESD performance for deep submicron CMOS technology
Authors: Bock, Karlheinz ×
Keppens, Bart
De Heyn, Vincent
Groeseneken, Guido
Ching, L. Y
Naem, Abdalla #
Issue Date: 1999
Host Document: pages:83-93
Conference: Tagungsband 6th ESD-Forum; October 1999; München, Germany. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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