|ITEM METADATA RECORD
|Title: ||Scanning spreading resistance microscopy of fully depleted silicon-on-insulator devices|
|Authors: ||Alvarez, David ×|
Vandervorst, Wilfried #
|Issue Date: ||2003 |
|Series Title: ||Microelectronic Engineering vol:67-68 pages:945-950|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Electrical Engineering - miscellaneous|
× corresponding author|
# (joint) last author|
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