Title: Fabrication and characterization of full diamond tips for scanning-spreading resistance microscopy
Authors: Alvarez, David ×
Fouchier, Marc
Kretz, J
Hartwich, J
Schoemann, S
Vandervorst, Wilfried #
Issue Date: Jun-2004
Series Title: Microelectronic Engineering vol:73-74 pages:910-915
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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