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Title: Gate-level characterization and reduction of substrate noise in integrated digital circuits
Authors: Badaroglu, Mustafa ×
Wambacq, Piet
Van der Plas, Geert
Donnay, Stephane
Gielen, Georges
De Man, Hugo #
Issue Date: 2003
Conference: 1st Flanders Engineering PhD Symposium location:Leuven Belgium date:11/12/03
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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