Title: Overview of the kinetics of the early stages of electromigration under low (=realistic) current density stress
Authors: Van Olmen, Jan ×
Manca, Jean
De Ceuninck, Ward
De Schepper, Luc
D'Haeger, V
Witvrouw, Ann
Maex, Karen #
Issue Date: 1998
Series Title: Microelectronics Reliability vol:38 issue:6-8 pages:1009-1014
Conference: Proceedings of the 9th European Symposium on Reliability of Electron Devices and Failure Physics (ESREF 98); 5-9 October 1998; C location:Copenhagen, Denmark date:Oct 5-9 1998
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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