Title: ESD protection methodology for deep-submicron CMOS
Authors: Bock, Karlheinz ×
Groeseneken, Guido
Maes, Herman #
Issue Date: 1998
Series Title: Microelectronics Reliability vol:38 issue:6-8 pages:997-1007
Conference: Proceedings of the 9th European Symposium on Reliability of Electron Devices and Failure Physics (ESREF 98); location:Copenhagen, Denmark date:5-9 October 1998
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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