ITEM METADATA RECORD
Title: ESD protection methodology for deep-submicron CMOS
Authors: Bock, Karlheinz ×
Groeseneken, Guido
Maes, Herman #
Issue Date: 1998
Host Document: pages:997-1007
Conference: Proceedings of the 9th European Symposium on Reliability of Electron Devices and Failure Physics (ESREF 98); 5-9 October 1998; C location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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