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Title: Analysis of Iddq failures through spectral photon emission microscopy
Authors: Rasras, Mahmoud ×
De Wolf, Ingrid
Bender, Hugo
Groeseneken, Guido
Maes, Herman
Verhaverbeke, Steven
De Pauw, P #
Issue Date: 1998
Host Document: pages:877-882
Conference: Proceedings of the 9th European Symposium on Reliability of Electron Devices and Failure Physics (ESREF 98); 5-9 October 1998; C
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Semiconductor Physics Section
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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