Title: Silicon scaling and its consequences for memory technology
Authors: Maes, Herman
Van Houdt, Jan
Issue Date: 2003
Conference: 19th IEEE Nonvolatile Semiconductor Memory Workshop location:Leuven Belgium date:16/02/03
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems

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