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Title: Improvement of write/erase cycling of memory cells with SiO2/HfO2 tunnel dielectric
Authors: Blomme, Pieter ×
Govoreanu, Bogdan
Van Houdt, Jan
De Meyer, Christina #
Issue Date: 2003
Publisher: IEEE
Host Document: pages:95-98
Conference: International Reliability Workshop Final Report location:Leuven Belgium date:13/10/03
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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