Title: Soft breakdown in ultrathin gate oxides: correlation with the percolation theory of nonlinear conductors
Authors: Houssa, Michel ×
Nigam, Tanya
Mertens, Paul
Heyns, Marc #
Issue Date: 1998
Publisher: American Institute of Physics
Series Title: Applied Physics Letters vol:73 issue:4 pages:514-16
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Semiconductor Physics Section
Clinical Residents Medicine
Surface and Interface Engineered Materials
× corresponding author
# (joint) last author

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