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Title: Analysis of the gate voltage fluctuations in ultra-thin gate oxides after soft breakdown
Authors: Houssa, Michel ×
Vandewalle, N
Nigam, Tanya
Ausloos, M
Mertens, Paul
Heyns, Marc #
Issue Date: 1998
Host Document: pages:909-12
Conference: Technical Digest International Electron Devices Meeting - IEDM; 6-9 Dec. 1998; San Francisco, CA, USA. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Semiconductor Physics Section
Clinical Residents Medicine
Surface and Interface Engineered Materials
× corresponding author
# (joint) last author

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