Title: Hot carrier degradation phenomena in lateral and vertical DMOS transistors
Authors: Moens, Peter ×
Van den Bosch, Geert
Groeseneken, Guido #
Issue Date: Apr-2004
Series Title: IEEE Transactions on Electron Devices vol:51 issue:4 pages:623-628
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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