Title: Investigation and comparison of the noise in the gate and substrate current after soft-breakdown
Authors: Crupi, Felice ×
Degraeve, Robin
Groeseneken, Guido
Nigam, Tanya
Maes, Herman #
Issue Date: 1999
Publisher: Publication Board, Japanese Journal of Applied Physics
Series Title: Japanese journal of applied physics. Part 1, Regular papers short notes & review papers vol:38 issue:4B pages:2219-2222
ISSN: 0021-4922
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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