Title: Origin of the substrate current after soft-breakdown in thin oxide n-MOSFETs
Authors: Crupi, Felice ×
Iannaccone, G
Neri, B
Crupi, Isodiana
Degraeve, Robin
Groeseneken, Guido
Maes, Herman #
Issue Date: 1999
Host Document: pages:77-80
Conference: IFPA '99 - Proceedings of the 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits;
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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