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Title: P-N junction peripheral current analysis using gated diode measurements
Authors: Czerwinski, A ×
Simoen, Eddy
Poyai, Amporn
Claeys, Cor #
Issue Date: 1999
Host Document: pages:437-442
Conference: Proceedings of the 8th International Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology - GADEST '99; 2
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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