Title: Dynamics of electromigration induced void-hillock growth and precipitation/dissolution of addition elements studied by in-situ electron microscopy resistance measurements
Authors: D'Haen, Jan ×
Cosemans, P
Manca, Jean
Lekens, Geert
Martens, T
De Ceuninck, Ward
D'olieslaeger, Marc
De Schepper, Luc
Maex, Karen #
Issue Date: 1999
Series Title: Microelectronics Reliability vol:39 issue:11 pages:1617-1630
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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