|ITEM METADATA RECORD
|Title: ||Scanning spreading resistance microscopy: sub-nm resolution carrier profiling with high sensitivity in advanced devices|
|Authors: ||Vandervorst, Wilfried|
|Issue Date: ||2005 |
|Conference: ||Workshop on Scanning Probe Microscopy location:Leuven Belgium date:09/11/05|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||Electrical Engineering - miscellaneous|
|Files in This Item:
There are no files associated with this item.
Request a copy
All items in Lirias are protected by copyright, with all rights reserved.