Title: Transient phenomena of silicon under oxygen bombardment
Authors: Deleu, Jeroen
Brijs, Bert
Vandervorst, Wilfried
Issue Date: 1998
Conference: SIMS Europe Workshop; 4-6 October 1998; Münster, Germany.
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous

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