Title: On the properties of the gate and substrate current after soft breakdown in ultrathin oxide layers
Authors: Crupi, Felice ×
Degraeve, Robin
Groeseneken, Guido
Nigam, Tanya
Maes, Herman #
Issue Date: 1998
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE transactions on electron devices vol:45 issue:11 pages:2329-34
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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