|ITEM METADATA RECORD
|Title: ||A new physically-based model for temperature acceleration of time-to-breakdown|
|Authors: ||Pangon, Nadège|
|Issue Date: ||1998 |
|Conference: ||29th IEEE Semiconductor Interface Specialists Conference - SISC; 3-5 Dec. 1998; San Diego, CA, USA. location:Leuven Belgium|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||Electrical Engineering - miscellaneous|
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
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