Title: Impact of band structure on charge trapping in thin SiO2/Al2O3/poly-Si gate stacks
Authors: Pantisano, Luigi ×
Lucci, L
Cartier, Ed
Kerber, Andreas
Groeseneken, Guido
Green, M
Selmi, L #
Issue Date: May-2004
Series Title: IEEE Electron Device Letters vol:25 issue:5 pages:320-322
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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