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Title: RTS noise due to lateral isolation related defects in submicron
Authors: Lukyanchikova, N ×
Petrichuk, M
Garbar, N
Simoen, Eddy
Claeys, Cor #
Issue Date: 1998
Series Title: Microelectronics Reliability vol:38 pages:1561-68
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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