Title: Two-dimensional carrier profiling of InP-based structures using scanning spreading resistance microscopy
Authors: De Wolf, Peter ×
Geva, M
Reynolds, C. L
Hantschel, Thomas
Vandervorst, Wilfried
Bylsma, R. B #
Issue Date: 1999
Series Title: Journal of Vacuum Science & Technology A, Vacuum, Surfaces and Films vol:17 issue:4 pages:1285-1288
ISSN: 0734-2101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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