Title: Analysis of high voltage TDDB measurements on Ta2O5/SiO2 stack
Authors: Degraeve, Robin ×
Kaczer, Ben
Houssa, Michel
Groeseneken, Guido
Heyns, Marc
Jeon, J. S
Halliyal, A #
Issue Date: 1999
Host Document: pages:327-330
Conference: International Electron Devices Meeting. Technical digest; December 1999; Washington, D.C. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Semiconductor Physics Section
Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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