Title: A new lifetime extrapolation technique for LDD NMOSFETS under hot-carrier degradation
Authors: Dreesen, R ×
Croes, Kris
Manca, Jean
De Ceuninck, Ward
De Schepper, Luc
Pergoot, A
Groeseneken, Guido #
Issue Date: 1999
Host Document: pages:584-587
Conference: ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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