Title: Correlation between the l/f noise parameters and the effective low-field mobility in HfO2 gate dielectric n-channel metal-oxide-semiconductor field-effect transistors
Authors: Simoen, Eddy ×
Mercha, Abdelkarim
Claeys, Corneel
Young, E #
Issue Date: 2004
Series Title: Applied Physics Letters vol:85 issue:6 pages:1057-1059
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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