Title: The mechanisms of hot carrier degradation and oxide breakdown in submicron CMOS techmologies
Authors: Groeseneken, Guido
Issue Date: 1999
Conference: 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits; July 1999; Singapore. location:Leuven Belgium
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors

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