|ITEM METADATA RECORD
|Title: ||Impact of temperature and breakdown statistics on reliability predictions for ultra-thin oxides|
|Authors: ||Groeseneken, Guido|
|Issue Date: ||1999 |
|Conference: ||MRS Fall Meeting Symposium on Structural and Electronic Properties of Ultrathin Dielectrics on Silicon and Related Structures; N location:Leuven Belgium|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||Electrical Engineering - miscellaneous|
ESAT - MICAS, Microelectronics and Sensors
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