Title: Impact of temperature and breakdown statistics on reliability predictions for ultra-thin oxides
Authors: Groeseneken, Guido
Degraeve, Robin
Kaczer, Ben
Issue Date: 1999
Conference: MRS Fall Meeting Symposium on Structural and Electronic Properties of Ultrathin Dielectrics on Silicon and Related Structures; N location:Leuven Belgium
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors

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