Title: Reliability of ultra-thin oxides for the giga-bit generations
Authors: Groeseneken, Guido ×
Degraeve, Robin
Nigam, Tanya
Kaczer, Ben
Maes, Herman #
Issue Date: 1999
Host Document: pages:72-80
Conference: ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.