Title: Hot carrier degradation and time-dependent dielectric breakdown in oxides
Authors: Groeseneken, Guido ×
Degraeve, Robin
Nigam, Tanya
Van den bosch, G
Maes, Herman #
Issue Date: 1999
Publisher: North-Holland
Series Title: Microelectronic Engineering vol:49 issue:01/02/07 pages:27-40
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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