Title: Effect of extreme surface roughness on the electrical characteristics of ultra-thin gate oxides
Authors: Houssa, Michel ×
Nigam, Tanya
Mertens, Paul
Heyns, Marc #
Issue Date: 1999
Publisher: Pergamon Press
Series Title: Solid-State Electronics vol:43 issue:1 pages:159-168
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Semiconductor Physics Section
Clinical Residents Medicine
Surface and Interface Engineered Materials
× corresponding author
# (joint) last author

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